ICs fabricated using nanometer processes using current design and test methodologies suffer from yield, quality and cost problems. Genesys Testware provides IC design engineers the tools to solve these problems. These tools are effective, efficient and require minimal changes to design and test flows.
News
Genesys Testware today announced the general availability of ArraytestMaker™ Diagnostics – a software tool for automated batch-mode diagnosis and characterization of embedded memories. Automated d more
Events
Desgin Automation Conference (DAC) 2009 is the premier conference for the Electronic Design Automation (EDA) community. The conference hosts tutorials, paper presentations and exhibits. more